Introduction to Advanced System-on-Chip Test Design and Optimization

光电子学与激光技术

原   价:
1657.5
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1326.00
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平台大促 低至8折优惠
作      者
出  版 社
出版时间
2005年11月07日
装      帧
精装
ISBN
9781402032073
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页      码
388
语      种
英语
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图书简介

Testing of Integrated Circuits is important to ensure the production of fault-free chips. However, testing is becoming cumbersome and expensive due to the increasing complexity of these ICs. Technology development has made it possible to produce chips where a complete system, with an enormous transistor count, operating at a high clock frequency, is placed on a single die - SOC (System-on-Chip). The device size miniaturization leads to new fault types, the increasing clock frequencies enforces testing for timing faults, and the

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