Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization

用于材料表征的原子力显微镜和拉曼光谱学的*进展

凝聚态物理学

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出  版 社
出版时间
2022年01月07日
装      帧
精装
ISBN
9781839682292
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页      码
274
开      本
9.61 x 6.69 x 0.69
语      种
英文
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图书简介
This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy.
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