Optical Inspection of Microsystems, Second Edition

微系统光学检测 第2版

光电子学与激光技术

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2738.75
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2191.00
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发货周期:预计5-7周发货
作      者
出  版 社
出版时间
2019年07月10日
装      帧
精装
ISBN
9781498779470
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页      码
590
开      本
7 x 10
语      种
英文
版      次
2
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图书简介
This book provides an up-to-date survey of the most important and widely used full-field optical metrology and inspection technologies. Techniques such as interference microscopy, laser Doppler vibrometry, holography, speckle metrology, and spectroscopy are included. In this new edition are also found calibration of optical measurement systems for the insepction of MEMS, numerical tools for the characterization of microelectromechanical systems, deflectrometry for the inspection of MEMS, digitial holographic microscropy for the inspection of MEMS, and characterization of the dynamics of MEMS.
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