Cluster Secondary Ion Mass Spectrometry:Principles and Applications(Wiley Series on Mass Spectrometry)

集群二次离子质谱法:原理与应用

分析化学

原   价:
1586.25
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1269.00
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发货周期:预计3-5周发货
作      者
出  版 社
出版时间
2013年05月14日
装      帧
精装
ISBN
9780470886052
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页      码
368
语      种
英文
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图书简介
This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors. The text covers a wide range of topics, encompassing fundamentals, theory, and applications including cluster sources, organic and polymeric depth profiling, and 3-D imaging in organic and polymeric materials. Written by founders in the field, this guide creates a peerless compendium of knowledge on this cutting edge set of methods.
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