Electrical Design of Through Silicon Via

硅通孔技术的电气设计

光电子学与激光技术

原   价:
1105
售   价:
884.00
优惠
平台大促 低至8折优惠
出  版 社
出版时间
2014年05月15日
装      帧
精装
ISBN
9789401790376
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页      码
280
语      种
英语
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库存 30 本
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图书简介
Through Silicon Via (TSV) is a key technology for realizing three-dimensional integrated circuits (3D ICs) for future high-performance and low-power systems with small form factors. This book covers both qualitative and quantitative approaches to give insights of modeling TSV in a various viewpoints such as signal integrity, power integrity and thermal integrity. Most of the analysis in this book includes simulations, numerical modelings and measurements for verification. The author and co-authors in each chapter have studied deep into TSV for many years and the accumulated technical know-hows and tips for related subjects are comprehensively covered.
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