Photomodulated Optical Reflectance

光调制光学反射率

光电子学与激光技术

原   价:
1105
售   价:
884.00
优惠
平台大促 低至8折优惠
作      者
出  版 社
出版时间
2012年06月15日
装      帧
精装
ISBN
9783642301070
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页      码
228
语      种
英语
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图书简介
One of the critical issues in semiconductor technology is the precise electrical characterization of ultra-shallow junctions. Among the plethora of measurement techniques, the optical reflectance approach developed in this work is the sole concept that does not require physical contact, making it suitable for non-invasive in-line metrology. This work develops extensively all the fundamental physical models of the photomodulated optical reflectance technique and introduces novel approaches that extend its applicability from dose monitoring towards detailed carrier profile reconstruction. It represents a significant breakthrough in junction metrology with potential for industrial implementation.
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