Hot Carrier Degradation in Semiconductor Devices

半导体器件的热载流子退化

光电子学与激光技术

原   价:
1105
售   价:
884.00
优惠
平台大促 低至8折优惠
作      者
出版时间
2014年11月15日
装      帧
精装
ISBN
9783319089935
复制
页      码
517
语      种
英语
综合评分
暂无评分
我 要 买
- +
库存 29 本
  • 图书详情
  • 目次
  • 买家须知
  • 书评(0)
  • 权威书评(0)
图书简介
This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today’s most complicated reliability issues in semiconductor devices.  Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy (“become hot”), interaction of an ensemble of colder and hotter carriers with defect precursors, which eventually leads to the creation of a defect, and a description of how these defects interact with the device, degrading its performance. 
本书暂无推荐
本书暂无推荐
看了又看
  • 上一个
  • 下一个