Electrothermal Analysis of VLSI Systems

光电子学与激光技术

原   价:
1105
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884.00
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平台大促 低至8折优惠
作      者
出  版 社
出版时间
2013年10月15日
装      帧
平装
ISBN
9781475773736
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页      码
210
语      种
英语
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图书简介
Electrothermal Analysis of VLSI Systems addresses electrothermal problems in modern VLSI systems. Part I, The Building Blocks, discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires (including power analysis, temperature-dependent device modeling, thermal/electrothermal simulation, and experimental setup-calibration). Part II, The Applications, discusses three important applications of VLSI electrothermal analysis including temperature-dependent electromigration diagnosis, cell-level thermal placement and temperature-driven power and timing analysis. Electrothermal Analysis of VLSI Systems will be useful for researchers in the fields of IC reliability analysis and physical design, as well as VLSI designers and graduate students.
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