MEMS Reliability

光电子学与激光技术

原   价:
1272.5
售   价:
1018.00
优惠
平台大促 低至8折优惠
作      者
出  版 社
出版时间
2013年01月15日
装      帧
平装
ISBN
9781461427360
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页      码
291
语      种
英语
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库存 30 本
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图书简介
The successful launch of viable MEMs product hinges on MEMS reliability, the reliability and qualification for MEMs based products is not widely understood. Companies that have a deep understanding of MEMs reliability view the information as a competitive advantage and are reluctant to share it.MEMs Reliability, focuses on the reliability and manufacturability of MEMS at a fundamental level by addressing process development and characterization, material property characterization, failure mechanisms and physics of failure (POF), design strategies for improving yield, design for reliability (DFR), packaging and testing.
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